WebREVISION J - Stress-Test-Driven Qualification of Integrated Circuits - Aug. 1, 2024. REVISION I.01 - Stress-Test-Driven Qualification of Integrated Circuits - Sept. 1, 2016. … Web(From JEDEC Board Ballots JCB-99-89, JCB-99-89A, JCB-05-49, JCB-10-60, JCB-16-47, and JCB-17-20 formulated under the cognizance of JC-14.1 Committee on Reliability …
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WebJESD47L Published: Dec 2024 This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. Committee (s): JC-14, JC-14.3 Available for purchase: $87.38 Add to Cart Paying JEDEC Members may login for free access. WebJESD-47 › Stress-Test-Driven Qualification of Integrated Circuits JESD-47 - REVISION L - CURRENT Show Complete Document History How to Order Standards We Provide … WebEIA/JESD 47 Stress-Test Driven Qualification of Integrated Circuits EIA/JEP 122 Failure Mechanism and Models for Silicon Semiconductor Devices 2 Apparatus The performance of this test requires equipment that is capable of providing the particular stress conditions to which the test samples will be subjected. 2.1 Circuitry bugs bunny show theme song lyrics